ГОСТ IEC 62321-3-1—2016
Библиография
[1]BERTIN, E.R,
Principles andpractices ofX-ray spectrometric analysis,
2nd Edition Plenum Press, N.Y.
[2] BUHRKE, V.E., JENKINS, R., SMITH, DK.,
A practical guide for the preparation ofspecimens forX-ray fluorescence
and X-ray diffraction analysis,
Wiley-VCHR
[3]VAN GRIEKEN, R. and MARKOWICZ, A.,
Handbook ofX ray spectrometry,
2nd Edition, Marcel Dekker Inc.
[4]ASTM C 982-03,
Guide for selecting components for energy-dispersive X-ray fluorescence systems
[5]ASTM C1118-07,
Guide for selecting components for wavelength-dispersive X-ray fluorescence systems
[6]ASTM E 1172-87,
Standardpractice for describing and specifying a wavelengthdispersive X-ray spectrometer
[7]ISO 5725-2,
Accuracy (trueness and precision) ofmeasurement methods and results
—
Basic method for the
determination ofrepeatability and reproducibility ofa standard measurement method
[8] International Union of Pure and Applied Chemistry,
Harmonized guidelines forsingle laboratory validation ofmethods
ofanalysis
(IUPAC Technical Report), Pure Appl. Chem., 2002, vol. 74, no. 5, p. 835—855
[9] International Union of Pure and Applied Chemistry,
Nomenclature in Evaluation of analytical methods including de
tection and quantification limits,
Pure Appl. Chem., 1995, vol. 67, no. 10, p.1699—1723
[10] BECKER, D. et al.,
Use of NIST standard reference materials for decisions on performance of analytical chemical
methods and laboratories,
National Institute of Standards and Technology (NIST) Special Publication 829, 1992
Дополнительные источники, не процитированные по тексту
[11] ASTM Е 1361-02,
Guide for correction ofinter-element effects in X-ray spectrometric analysis
[12] ASTM E 1621-05,
Standard guide forX-ray emission spectrometric analysis
[13] ASTM E 1622-94,
Standard practice for correction of spectral line overlap in wavelength-dispersive X-ray
spectrometry
[14] ASTM F 2617-08,
Standard test method for identification and quantification of chromium, bromine, cadmium.
mercury and lead in polymeric material using energy dispersive X ray spectrometry
32