ГОСТ ISO/TS 80004-6—2016
optical spectroscopy4.1
particle2.9
particle shape3.1.3
particle size3.1.1
particle size distribution3.1.2
particle tracking analysis3.2.8
PCS3.2.7
photoluminescence4.3
photoluminescence spectroscopy4.4
photon correlation spectroscopy3.2.7
PL spectroscopy4.4
PTA3.2.8
QCM5.1.1
QELS3.2.7
quantum dot2.8
quartz crystal microbalance5.1.1
quasi-elastic light scattering3.2.7
radius of gyration3.2.1
Raman effect4.9
Raman spectroscopy4.10
SANS3.2.2
SAXS3.2.4
scanning electron microscopy3.5.5
scanning force microscopy3.5.2
scanning ion microscopy3.5.9
scanning near-field optical microscopy3.5.4
scanning probe microscopy3.5.1
scanning transmission electron microscopy3.5.7
scanning tunnelling microscopy3.5.3
SEC3.4.3
secondary-ion mass spectrometry4.23
SEEC microscopy3.5.11
SEM3.5.5
SERS4.11
SFM3.5.2
shear plane5.3.3
SIMS4.23
size-exclusion chromatography3.4.3
slipping plane5.3.3
small angle neutron scattering3.2.2
small angle X-ray scattering3.2.4
SNOM3.5.4
SPM3.5.1
STEM3.5.7
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