ГОСТ Р 56647—2015
particle size3.1.1
particle size distribution3.1.2
particle tracking analysis3.2.8
PCS3.2.7
photoluminescence4.3
photoluminescence spectroscopy4.4
photon correlation spectroscopy3.2.7
PL spectroscopy4.4
PTA3.2.8
QCM
5.1.1
QELS3.2.7
quantum dot2.8
quartz crystal microbalance5.1.1
quasi-elastic light scattering3.2.7
radius of gyration3.2.1
Raman effect4.9
Raman spectroscopy4.10
SANS3.2.2
SAXS3.2.4
scanning electron microscopy3.5.5
scanning force microscopy3.5.2
scanning ion microscopy3.5.9
scanning near-field optical microscopy3.5.4
scanning probe microscopy3.5.1
scanning transmission electron microscopy3.5.7
scanning tunnelling microscopy3.5.3
SEC3.4.3
secondary-ion mass spectrometry4.23
SEEC microscopy3.5.11
SEM3.5.5
SERS4.11
SFM3.5.2
shear plane5.3.3
SIMS4.23
size-exclusion chromatography3.4.3
slipping plane5.3.3
small angle neutron scattering3.2.2
small angle X-ray scattering3.2.4
SNOM3.5.4
SPM3.5.1
STEM3.5.7
STM3.5.3
super-resolution microscopy3.5.15
surface enhanced ellipsometric contrast microscopy3.5.11
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