ГОСТ Р 56189—2014
Библиография
[1] CZICHOS. Н.. SAITO. Т.. SMITH. L.. Eds. Springer handbook ofmetrology and testing. Springer (2011). Chapter 9.
[2] WEBSTER. J. G. Themeasurement, instrumentation, andsensors handbook. CRC Press (1999).
[3] SCHRODER. D. K. Semiconductor material and device characterization. John Wiley & Sons. New York (1998).
[4] SMITS. F. M. Measurement of sheet resistivities with the four point probe. BeSISyst. Tech. J. 1958. 37. 711-718.
[5] KUPHALDT. T. R. «Kelvin (4-wire) resistance measurement». All about circuits: Volume l-DC (2003).
[6] HART. A. J. and SLOCUM. A. H. Force output, control of film structure, and microscale shape transfer by carbon
nanotube growth under mechanical pressure. Nano Lett. 2006, 6(6), 1254-1260.
[7] KIM. J.-S.. CHOI. K„ KIM. J.-J.. NOH. D.-Y.. PARK. S.-К.. LEE. H.-J. and LEE. H. Charge-transfer interaction in
single-walled carbon nanotubes with tetrathiafuh/alene and their applications. J. Nanosci. Nanotech.. 2007. 7(11).
4116-4119.
[8] FORNEY. M.
W.
and POLER J. C. Sonochemical formation of methyl hydroperoxide in polar aprotic solvents and its
effect on single-walled carbon nanotube dispersion stability. J. Am. Chem. Soc. 2010. 132(2). 791-797.
[9] SEMI MF374-0307 Test method for sheet resistance ofsilicon epitaxial, diffused, polysilicon, and ion-implanted lay
ers using an in-line four-point probe with the single-configuration procedure. SEMI. USA (2007).
[10] SWARTZENDRUBER. L. J. Correction Factor Tables for Four-Point Probe Resistivity Measurements on Thin. Cir
cular Semiconducting Samples. NBS. Technical Note 199. April 15 (1964).
[11] AUSMAN. K. D.. RICHARD. P.. LOURIE. O.. RUOFF, R. S. and KOROBOV. M. Organic solvent dispersions of sin
gle-walled carbon nanotubes: toward solutions of pristine nanotubes. J. Phys. Chem. В 2000. 104(38). 8911-8915.
[12] MOONOOSAWMY. K. R. and KRUSE. P. To dope or not to dope: The effect of sonicating single-wall carbon nano-
tubes in common laboratory solvents on their electronic structure. J. Am. Chem. Soc. 2008. 130(40). 13417-13424.
[13] IEC 62624:2009. Test methods for measurement ofelectrical properties of carbon nanotubes.
[14] ISO/TS 80004-3. Nanotechnologies — Vocabulary— Part 3: Carbon лэло-objecfs.
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